In biology, defects are generally bad. But in materials science, defects can be intentionally tuned to give materials useful new properties. Today, atomic-scale defects are carefully introduced during the manufacturing process of products like steel, semiconductors, and solar cells to help improve strength, control electrical conductivity, optimize performance, and more.
But even as defects have become a powerful tool, accurately measuring different types of defects and their concentrations in finished products has been challenging, especially without cutting open or damaging the final material. Without knowing what defects are in their materials, engineers risk making products that perform poorly or have unintended properties.
Now, MIT researchers have built an AI model capable of classifying and quantifying certain defects using data from a noninvasive neutron-scattering technique. The model, which was trained on 2,000 different semiconductor materials, can detect up to six kinds of point defects in a material simultaneously, something that would be impossible using conventional techniques alone.
