In experiments at two Department of Energy national labs – SLAC National Accelerator Laboratory and Lawrence Berkeley National Laboratory – scientists at Hewlett Packard Enterprise (HPE) have experimentally confirmed critical aspects of how a new type of microelectronic device, the memristor, works at an atomic scale.

This result is an important step in designing these solid-state devices for use in future computer memories that operate much faster, last longer and use less energy than today’s flash memory. The results were published in February in Advanced Materials.

“We need information like this to be able to design memristors that will succeed commercially,” said Suhas Kumar, an HPE scientist and first author on the group’s technical paper.

Terahertz radiation, or T-rays, can do some really incredible stuff. It can be used to scan for tumors and bombs build ultrafast wireless networks and see through solid objects. As an imaging technology, however, T-ray cameras have always had a resolution limitation. Well, they used to. Researchers at the University of Exter has developed a new terahertz camera that can see at a microscopic level — and they want to use it to find defects in microchips.

This breakthrough kind of changes the game for terahertz imaging. The radiation has always been able to look through solid objects without damaging them — which is why it’s frequently used in the art world to look past the surface layer of various masterpieces — but resolution limitations kept it from being used to diagnose broken computer chips.

Project lead Rayko Stantchev says his team has effectively doubled the technology’s resolution, creating a proof-of-principle prototype that can see a microscopic image printed on a circuit board obscured by a thick silicon wafer. “With our device you could test the quality of microchips that have buried under optically-opaque materials,” Stantchev says. “Allowing you to tell if a hidden chip is broken without having to open it up.”