An international research team from Germany, Switzerland and Japan has demonstrated in a recent study that a single reflection zone plate (RZP) can perform both soft X-ray imaging and resonant inelastic X-ray scattering (RIXS) mapping. The approach could simplify future instruments that need to determine both where structures are located in a material and how their electronic properties vary.

The study, which was published in Optics Express, was carried out at the P04 beamline of the PETRA III synchrotron radiation source at DESY in Hamburg. The researchers used an RZP, a precisely nanostructured reflective optic that simultaneously focuses and disperses soft X-rays. Conventional X-ray imaging provides spatial information about a sample, whereas spectroscopy reveals its electronic structure, chemical bonding and excited states.

Combining the two capabilities usually requires several optical components and demanding alignment procedures. In the new work, the RZP acts as an all-in-one element for reflection, focusing, imaging and spectral dispersion.