Feb 16, 2017

Nanoelectronic thread probes form reliable, scar-free integration with the brain

Posted by in categories: engineering, neuroscience

Another new interface method.

Engineering researchers at The University of Texas at Austin have designed ultra-flexible, nanoelectronic thread (NET) brain probes that can achieve more reliable long-term neural recording than existing probes and don’t elicit scar formation when implanted.

The researchers described their findings in a research article published in Science Advances (“Ultraflexible nanoelectronic probes form reliable, glial scar–free neural integration”).

ultra-flexible probe in neural tissue

This is a rendering of the ultra-flexible probe in neural tissue gives viewers a sense of the device’s tiny size and footprint in the brain.

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