{"id":237461,"date":"2026-05-20T03:53:54","date_gmt":"2026-05-20T08:53:54","guid":{"rendered":"https:\/\/lifeboat.com\/blog\/2026\/05\/researchers-solve-longstanding-problem-in-measuring-semiconductor-defects"},"modified":"2026-05-20T03:53:54","modified_gmt":"2026-05-20T08:53:54","slug":"researchers-solve-longstanding-problem-in-measuring-semiconductor-defects","status":"publish","type":"post","link":"https:\/\/lifeboat.com\/blog\/2026\/05\/researchers-solve-longstanding-problem-in-measuring-semiconductor-defects","title":{"rendered":"Researchers solve longstanding problem in measuring semiconductor defects"},"content":{"rendered":"<p><a class=\"aligncenter blog-photo\" href=\"https:\/\/lifeboat.com\/blog.images\/researchers-solve-longstanding-problem-in-measuring-semiconductor-defects2.jpg\"><\/a><\/p>\n<p>Researchers at Sandia National Laboratories and Auburn University have developed a new method to more accurately detect atomic-scale defects in electronic materials, an advance that could help improve technologies ranging from electric vehicles to high-power electronics. The study, <a href=\"https:\/\/pubs.aip.org\/jap\/article\/139\/18\/185708\/3391116\/The-completed-High-Low-method-for-interface-state\" target=\"_blank\">appearing<\/a> in the <i>Journal of Applied Physics<\/i>, addresses a longstanding challenge in understanding what happens at the critical boundary where a semiconductor meets an insulating layer.<\/p>\n<p>At this interface, microscopic defects can trap electrical charge and quietly reduce device performance, even when the device otherwise appears to function normally. These defects can limit efficiency, increase electrical losses, and reduce the performance of advanced semiconductor devices.<\/p>\n<p>Scientists commonly study these defects by comparing how a device responds to slow and fast electrical signals. However, the technique depends on knowing a key device property, the insulator capacitance, with very high accuracy. Even tiny errors can produce misleading results, sometimes making it appear that far more defects exist than are actually present.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Researchers at Sandia National Laboratories and Auburn University have developed a new method to more accurately detect atomic-scale defects in electronic materials, an advance that could help improve technologies ranging from electric vehicles to high-power electronics. The study, appearing in the Journal of Applied Physics, addresses a longstanding challenge in understanding what happens at the [\u2026]<\/p>\n","protected":false},"author":662,"featured_media":0,"comment_status":"open","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[219,17,1491],"tags":[],"class_list":["post-237461","post","type-post","status-publish","format-standard","hentry","category-physics","category-sustainability","category-transportation"],"_links":{"self":[{"href":"https:\/\/lifeboat.com\/blog\/wp-json\/wp\/v2\/posts\/237461","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/lifeboat.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/lifeboat.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/lifeboat.com\/blog\/wp-json\/wp\/v2\/users\/662"}],"replies":[{"embeddable":true,"href":"https:\/\/lifeboat.com\/blog\/wp-json\/wp\/v2\/comments?post=237461"}],"version-history":[{"count":0,"href":"https:\/\/lifeboat.com\/blog\/wp-json\/wp\/v2\/posts\/237461\/revisions"}],"wp:attachment":[{"href":"https:\/\/lifeboat.com\/blog\/wp-json\/wp\/v2\/media?parent=237461"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/lifeboat.com\/blog\/wp-json\/wp\/v2\/categories?post=237461"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/lifeboat.com\/blog\/wp-json\/wp\/v2\/tags?post=237461"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}